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| | | ICS Series Variable Wavelength Detector |
| Get the benefits of performance and versatility of the ICS series Variable Wavelength Detector through the following unique features: High signal-to-noise ratio for maximum sensitivity Broad wavelength range from 190 to 900 nm Low noise and high light intensity over the full spectral range by using deuterium and tungsten lamps Full control and data collection through Chromeleon® 6 software USB-based digital data collection for simple installation Data collection rates up to 100 Hz Built-in holmium oxide filter for easy verification of wavelength accuracy Low baseline drift for reliable results Excellent resolution that yields high linearity Integrated low backpressure flow cell heat exchanger for thermal stability Lamp lifetime monitor to prevent downtime Multiple wavelength monitoring; up to four different wavelengths simultaneously
| | | ICS Series Variable Wavelength Detector Specifications | | Noise | Typically <±2.5 x µAU at 254 nm | | Drift | < 0.1 mAU/hr at 254 nm | | Wavelength accuracy | ±1 nm | | Wavelength Bandwidth | 6 nm at 254 nm | | Linearity | Up to 2.5 AU | | Data Collection Rate | Up to 100 Hz (Multiple wavelength version)
Up to 10 Hz (Single wavelength version) | | Flow Cell | PEEK 11 µL volume, 10 mm path length | | Lamps | Tungsten and deuterium | | Analog outputs | Two: Absorbance, 20-bit resolution, 0–1 Volt and 0–10 Volt. | | Dimensions (h x w x d) | 15.2 × 44.4 × 50.3 cm
(6.0 × 17.5 × 20 in.) | | Physical specifications | Power Requirements: 85–265 V ac, 47–63 Hz (autosensing)
Operating Temp. Range: 10–35 °C (50–95 °F)
Operating Humidity Range: 5–80% relative, noncondensing |
| | Order Information | | Call 1-800-DIONEX-0 (zero) for order information. |
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|  |  | Award-Winning ICS-3000 RFIC System | The ICS-3000 Reagent-Free™ IC (RFIC™) system has won Five Awards including Editors' Choice Silver Award as one of the best new products at Pittcon '05, Two Gold awards from Instrument Business Outlook. The ICS-3000 allows chemists to save time, labor, and operating cost while increasing the productivity and reproducibility of ion analysis for any application. |
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